Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9721337 | Detecting defects on a wafer using defect-specific information | Kenong Wu, Lisheng Gao | 2017-08-01 |
| 9189844 | Detecting defects on a wafer using defect-specific information | Kenong Wu, Lisheng Gao | 2015-11-17 |