Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6230293 | Method for quality and reliability assurance testing of integrated circuits using differential Iddq screening in lieu of burn-in | Sailesh Chittipeddi, Daryl E. Diehl, Thomas N. Hofacker, Richard Jenkins, Robert T. Smith +3 more | 2001-05-08 |