Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6230293 | Method for quality and reliability assurance testing of integrated circuits using differential Iddq screening in lieu of burn-in | Sailesh Chittipeddi, Daryl E. Diehl, Richard Jenkins, Mamata Patnaik, Robert T. Smith +3 more | 2001-05-08 | $34,526,000 |