| 6807505 |
Circuit with interconnect test unit |
Franciscus Gerardus Maria De Jong, Robertus M. W. Raaijmakers, Guillaume E. A. Lousberg |
2004-10-19 |
| 6622108 |
Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit |
Franciscus Gerardus Maria De Jong, Robertus M. W. Raaijmakers, Guillaume E. A. Lousberg |
2003-09-16 |
| 6297643 |
Connection test method |
Franciscus G. M. De Jong, Rodger Frank Schuttert, Johannes De Wilde |
2001-10-02 |
| 6119256 |
Apparatus for testing a fixed logic value interconnection between integrated circuits |
Franciscus G. M. De Jong |
2000-09-12 |
| 5978945 |
Tester arrangement comprising a connection module for testing, by way of the boundary scan test method, a carrier provided with a first number of digital ICS with BST logic and a second number of digital ICS without BST logic |
— |
1999-11-02 |
| 5781559 |
Testable circuit |
Franciscus G. M. De Jong, Johannes De Wilde, Rodger Frank Schuttert |
1998-07-14 |
| 5636229 |
Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns |
Lars A. R. Eerenstein |
1997-06-03 |
| 5097151 |
Sequential finite-state machine circuit and integrated circuit |
Lars A. R. Eerenstein |
1992-03-17 |
