Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10210292 | Process-metrology reproducibility bands for lithographic photomasks | Todd C. Bailey, Ioana Graur, Scott D. Halle | 2019-02-19 |
| 9928316 | Process-metrology reproducibility bands for lithographic photomasks | Todd C. Bailey, Ioana Graur, Scott D. Halle | 2018-03-27 |