LC

Lynn Cai

SY Synopsys: 6 patents #194 of 2,302Top 9%
NT Numerical Technologies: 1 patents #19 of 41Top 50%
Overall (All Time): #750,814 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7835565 System and method of providing mask defect printability analysis Linard Karklin, Linyong Pang 2010-11-16
7565001 System and method of providing mask defect printability analysis Linard Karklin, Linyong Pang 2009-07-21
7403649 System and method of providing mask defect printability analysis Linard Karklin, Linyong Pang 2008-07-22
7254251 System and method of providing mask defect printability analysis Linard Karklin, Linyong Pang 2007-08-07
6925202 System and method of providing mask quality control Linard Karklin, Linyong Pang 2005-08-02
6873720 System and method of providing mask defect printability analysis Linard Karklin, Linyong Pang 2005-03-29
6870951 Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysis 2005-03-22