Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230013 | Fully automated SEM sampling system for e-beam image enhancement | Wentian ZHOU, Teng Wang, Lingling PU, Wei Fang | 2025-02-18 |
| 11769317 | Fully automated SEM sampling system for e-beam image enhancement | Wentian ZHOU, Teng Wang, Lingling PU, Wei Fang | 2023-09-26 |
| 11694312 | Image enhancement for multi-layered structure in charged-particle beam inspection | Wei Fang, Ruochong FEI, Lingling PU, Wentian ZHOU, Bo Wang | 2023-07-04 |