Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230013 | Fully automated SEM sampling system for e-beam image enhancement | Liangjiang YU, Teng Wang, Lingling PU, Wei Fang | 2025-02-18 |
| 11769317 | Fully automated SEM sampling system for e-beam image enhancement | Liangjiang YU, Teng Wang, Lingling PU, Wei Fang | 2023-09-26 |
| 11756187 | Systems and methods of optimal metrology guidance | Lingling PU, Wei Fang, Nan Zhao, Teng Wang, Ming Xu | 2023-09-12 |
| 11694312 | Image enhancement for multi-layered structure in charged-particle beam inspection | Wei Fang, Ruochong FEI, Lingling PU, Liangjiang YU, Bo Wang | 2023-07-04 |
| 11216938 | Systems and methods of optimal metrology guidance | Lingling PU, Wei Fang, Nan Zhao, Teng Wang, Ming Xu | 2022-01-04 |