| 6587979 |
Partitionable embedded circuit test system for integrated circuit |
Ivan Batinic, Marc Loranger, Hiralal Ranga |
2003-07-01 |
| 6351814 |
Field programmable gate array with program encryption |
Ivan Batinic, Marc Loranger |
2002-02-26 |
| 6304989 |
Built-in spare row and column replacement analysis system for embedded memories |
Ivan Batinic |
2001-10-16 |
| 6092030 |
Timing delay generator and method including compensation for environmental variation |
Yervant David Lepejian, Julie Segal, John Caywood |
2000-07-18 |
| 6085346 |
Method and apparatus for built-in self test of integrated circuits |
Yervant David Lepejian, Hrant Marandjian, Hovhannes Ghukasyan |
2000-07-04 |
| 6011748 |
Method and apparatus for built-in self test of integrated circuits providing for separate row and column addresses |
Yervant David Lepejian, Hovhannes Ghukasyan |
2000-01-04 |
| 5983009 |
Automatic generation of user definable memory BIST circuitry |
Yervant David Lepejian, Hovhannes Ghukasyan |
1999-11-09 |
| 5974579 |
Efficient built-in self test for embedded memories with differing address spaces |
Yervant David Lepejian, Hrant Marandjian, Hovhannes Ghukasyan, John Caywood |
1999-10-26 |
| 5930814 |
Computer system and method for synthesizing a filter circuit for filtering out addresses greater than a maximum address |
Yervant David Lepejian, Hrant Marandjian, Hovhannes Ghukasyan |
1999-07-27 |