Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9097686 | Optical type inspection apparatus, inspection system and the wafer for coordinates management | Yoshio Bamba, Yukihisa Mohara | 2015-08-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9097686 | Optical type inspection apparatus, inspection system and the wafer for coordinates management | Yoshio Bamba, Yukihisa Mohara | 2015-08-04 |