Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11187992 | Predictive modeling of metrology in semiconductor processes | Raman K. Nurani, Anantha R. Sethuraman | 2021-11-30 |
| 11088039 | Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data | Raman K. Nurani, Anantha R. Sethuraman, Karanpreet Aujla | 2021-08-10 |
| 10614262 | Method of predicting areas of vulnerable yield in a semiconductor substrate | Raman K. Nurani, Anantha R. Sethuraman, Karanpreet Aujla | 2020-04-07 |
| 10579041 | Semiconductor process control method | Raman K. Nurani, Anantha R. Sethuraman | 2020-03-03 |
| 10579769 | Using design proximity index and effect-to-design proximity ratio to control semiconductor processes and achieve enhanced yield | Raman K. Nurani, Anantha R. Sethuraman | 2020-03-03 |
| 10481199 | Data analytics and computational analytics for semiconductor process control | Raman K. Nurani, Anantha R. Sethuraman | 2019-11-19 |