Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11088039 | Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data | Raman K. Nurani, Anantha R. Sethuraman, Koushik Ragavan | 2021-08-10 |
| 10614262 | Method of predicting areas of vulnerable yield in a semiconductor substrate | Raman K. Nurani, Anantha R. Sethuraman, Koushik Ragavan | 2020-04-07 |