Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10168286 | Defect observation device and defect observation method | Takehiro Hirai, Hideki Nakayama | 2019-01-01 |
| 7214937 | Electron microscope | Katsuaki Abe, Osamu Komuro | 2007-05-08 |