Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7271060 | Semiconductor processing methods | Sukesh Sandhu | 2007-09-18 |
| 7271435 | Modified source/drain re-oxidation method and system | Paul Rudeck, Francis Benistant | 2007-09-18 |
| 7091087 | Optimized flash memory cell | — | 2006-08-15 |
| 7037860 | Modified source/drain re-oxidation method and system | Paul Rudeck, Francis Benistant | 2006-05-02 |
| 6949792 | Stacked gate region of a memory cell in a memory device | Graham R. Wolstenholme | 2005-09-27 |
| 6808989 | Self-aligned floating gate flash cell system and method | Graham R. Wolstenholme | 2004-10-26 |
| 6790721 | Metal local interconnect self-aligned source flash cell | — | 2004-09-14 |
| 6759708 | Stacked gate region of a nonvolatile memory cell for a computer | Graham R. Wolstenholme | 2004-07-06 |
| 6756268 | Modified source/drain re-oxidation method and system | Paul Rudeck, Francis Benistant | 2004-06-29 |
| 6706594 | Optimized flash memory cell | — | 2004-03-16 |
| 6690051 | FLASH memory circuitry | Graham R. Wolstenholme | 2004-02-10 |
| 6674145 | Flash memory circuitry | Graham R. Wolstenholme | 2004-01-06 |
| 6653683 | Method and structure for an oxide layer overlying an oxidation-resistant layer | Paul Rudeck | 2003-11-25 |
| 6624022 | Method of forming FLASH memory | Graham R. Wolstenholme | 2003-09-23 |
| 6387777 | Variable temperature LOCOS process | — | 2002-05-14 |
| 6350708 | Silicon nitride deposition method | — | 2002-02-26 |
| 6297092 | Method and structure for an oxide layer overlaying an oxidation-resistant layer | Paul Rudeck | 2001-10-02 |
| 6204206 | Silicon nitride deposition method | — | 2001-03-20 |
| 6127287 | Silicon nitride deposition method for use in forming a memory cell dielectric | Li Li, Pierre C. Fazan, Zhiqiang Wu | 2000-10-03 |
| 5939333 | Silicon nitride deposition method | Li Li, Pierre C. Fazan, Zhiqiang Wu | 1999-08-17 |
| 5899702 | Methods for measuring surface area | Michael Nuttall | 1999-05-04 |
| 5578505 | Methods for measuring the surface area of a semiconductor wafer | Michael Nuttall | 1996-11-26 |