Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11902813 | Measurement result receiving apparatus, measuring apparatus, and method, program, and recording medium for the same | Takashi Fujisaki, Kenji Nishikawa | 2024-02-13 |
| 8601329 | Test apparatus and test method | Masaru Doi | 2013-12-03 |
| 6288955 | Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis | Ki-Sang Kang | 2001-09-11 |
| 6034905 | Apparatus for testing semiconductor memory device | Kunihiko Suzuki | 2000-03-07 |