Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7173857 | Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data | Hiroshi Kato, Yasuhiko Taito, Tsukasa Ooishi | 2007-02-06 |
| 6895537 | Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair | Tomoya Kawagoe | 2005-05-17 |
| 6891760 | Method of erasing information in non-volatile semiconductor memory device | — | 2005-05-10 |
| 6888775 | Semiconductor memory device for improvement of defective data line relief rate | — | 2005-05-03 |
| 6856550 | Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data | Hiroshi Kato, Yasuhiko Taito, Tsukasa Ooishi | 2005-02-15 |
| 6813188 | Non-volatile semiconductor memory device having a memory cell which stably retains information | — | 2004-11-02 |
| 6809969 | Non-volatile semiconductor memory device capable of rapid operation | Tsukasa Ooishi | 2004-10-26 |
| 6807101 | Semiconductor memory device | Tsukasa Ooishi, Hiroshi Kato | 2004-10-19 |
| 6778432 | Thin film magnetic memory device capable of stably writing/reading data and method of fabricating the same | — | 2004-08-17 |
| 6765832 | Semiconductor memory device with word line shift configuration | — | 2004-07-20 |
| 6744672 | Non-volatile semiconductor memory device capable of high-speed data reading | Tsukasa Ooishi, Hiroshi Kato | 2004-06-01 |
| 6717844 | Semiconductor memory device with latch circuit and two magneto-resistance elements | — | 2004-04-06 |
| 6671213 | Thin film magnetic memory device having redundancy repair function | — | 2003-12-30 |
| 6625072 | Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell | Tomoya Kawagoe | 2003-09-23 |
| 6584005 | Semiconductor memory device preventing erroneous writing in write operation and delay in read operation | Hiroshi Kato, Masatoshi Ishikawa, Tsukasa Ooishi, Hideto Hidaka | 2003-06-24 |
| 6545921 | Semiconductor memory device allowing spare memory cell to be tested efficiently | Katsumi Dosaka | 2003-04-08 |
| 6535993 | Testing apparatus for semiconductor memory device | Mitsuhiro Hamada | 2003-03-18 |
| 6421286 | Semiconductor integrated circuit device capable of self-analyzing redundancy replacement adapting to capacities of plural memory circuits integrated therein | Tsukasa Ooishi, Hideto Hidaka, Tomoya Kawagoe | 2002-07-16 |
| 6297997 | Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array | Mitsuhiro Hamada | 2001-10-02 |
| 6157973 | Microcomputer having memory and processor formed on the same chip to increase the rate of information transfer | Naoto Okumura, Akira Yamazaki | 2000-12-05 |
| 6130852 | Memory integrated circuit device including a memory having a configuration suitable for mixture with logic | Akira Yamazaki, Naoto Okumura, Takashi Higuchi | 2000-10-10 |
| 5835448 | Clock synchronous semiconductor memory device for determining an operation mode | Akira Yamazaki, Katsumi Dosaka | 1998-11-10 |
| 5708622 | Clock synchronous semiconductor memory device | Akira Yamazaki, Katsumi Dosaka | 1998-01-13 |
| 5521878 | Clock synchronous semiconductor memory device | Akira Yamazaki, Katsumi Dosaka | 1996-05-28 |