MH

Mitsuhiro Hamada

PA Panasonic: 3 patents #7,617 of 21,108Top 40%
Mitsubishi Electric: 3 patents #8,691 of 25,717Top 35%
NE Nec: 3 patents #4,195 of 14,502Top 30%
TO Toyota: 3 patents #8,352 of 26,838Top 35%
MC Mitsubishi Chemical: 2 patents #928 of 3,022Top 35%
Sumitomo Electric Industries: 1 patents #13,249 of 21,551Top 65%
TC Toyoda Gosei Co.: 1 patents #1,271 of 2,296Top 60%
SC Sanyo Electric Co.: 1 patents #3,644 of 6,347Top 60%
RT Renesas Technology: 1 patents #1,991 of 3,337Top 60%
Overall (All Time): #272,188 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
11535127 Interior structure of vehicle Ippei Kobayashi, Yoichi Tamura, Takahiko Aoki, Ryouhei Kawagishi 2022-12-27
11043825 Power supply device Motoji Takeuchi, Yusuke Omote, Takuya Hirota, Hisashi Kameyama, Jeewook Chang 2021-06-22
10550512 Oil agent for carbon-fiber-precursor acrylic fiber, oil agent composition for carbon-fiber-precursor acrylic fiber, oil-treatment-liquid for carbon-fiber-precursor acrylic fiber, and carbon-fiber-precursor acrylic fiber bundle Hiromi Aso, Satoshi Nagatsuka, Tetsuo Takano, Motoi Konishi, Masaaki Tsuchihashi 2020-02-04
9890481 Method for production of carbon fiber bundle Hiroyuki Nakao, Hiromi Aso, Yoshitaka Kageyama 2018-02-13
9487178 Head-protecting airbag device and method of folding airbag thereof Koji Kawamura, Taizo Suemitsu, Atsushi Kashio 2016-11-08
8354712 Semiconductor device and method of manufacturing the same Katsuyoshi Jokyu 2013-01-15
7968942 Semiconductor apparatus Tatsumi Kumekawa, Shuji Mizokuchi 2011-06-28
7839003 Semiconductor device including a coupling conductor having a concave and convex Kouichi Tomita 2010-11-23
7731274 Body support structure of a vehicle Fumihiko Kishima, Yoshihiro Juasa, Yukinori Osada, Toshihiro Fujiwara 2010-06-08
7290271 Optical disk apparatus Masanari Esaki, Yuichi Uchikawa 2007-10-30
6750672 Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same Masaaki Tanimura, Osamu Hashimoto 2004-06-15
6535993 Testing apparatus for semiconductor memory device Jun Ohtani 2003-03-18
6339555 Semiconductor memory device enabling test of timing standard for strobe signal and data signal with ease, and subsidiary device and testing device thereof Kenichi Yasuda 2002-01-15
6297997 Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array Jun Ohtani 2001-10-02
5278465 Semiconductor integrated circuit device having ECL gate group circuits and gate voltage control circuits 1994-01-11
5267205 Semiconductor memory device 1993-11-30
5113371 Semiconductor memory apparatus with a spare memory cell array 1992-05-12