Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12078659 | Method of inspecting semiconductor device, semiconductor device, and probe card | — | 2024-09-03 |
| 11372042 | Semiconductor device and burn-in test method thereof | Koji Suzuki | 2022-06-28 |
| 10608659 | A/D converter and semiconductor device | Yasuyuki Tanaka | 2020-03-31 |
| 7222279 | Semiconductor integrated circuit and test system for testing the same | — | 2007-05-22 |
| 6784684 | Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals | — | 2004-08-31 |
| 6774657 | Apparatus and method of inspecting semiconductor integrated circuit | Osamu Hashimoto | 2004-08-10 |
| 6750672 | Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same | Mitsuhiro Hamada, Osamu Hashimoto | 2004-06-15 |
| 6479363 | Semiconductor integrated circuit and method for testing the same | — | 2002-11-12 |
| 6317373 | Semiconductor memory device having a test mode and semiconductor testing method utilizing the same | — | 2001-11-13 |
| 5880998 | Synchronous semiconductor memory device in which current consumed by input buffer circuit is reduced | Yasuhiro Konishi | 1999-03-09 |