JH

John M. Heumann

HP HP: 11 patents #264 of 7,018Top 4%
AT Agilent Technologies: 10 patents #168 of 3,411Top 5%
Overall (All Time): #211,346 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7424141 System and method for performing auto-focused tomosynthesis David Gines, Tracy Ragland 2008-09-09
7373332 Methods and apparatus for detecting temporal process variation and for managing and predicting performance of automatic classifiers Jonathan Li 2008-05-13
7200534 Radiographic imaging systems and methods for designing same Gerald Meyer 2007-04-03
7108424 Method and apparatus for calibration of indirect measurement systems Eduardo Acosta 2006-09-19
7099435 Highly constrained tomography for automated inspection of area arrays Colin Fox, David Gines, Nicholas Tufillaro 2006-08-29
6850589 Tomography of curved surfaces David C. Reynolds 2005-02-01
6765981 Computed tomography 2004-07-20
6291978 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, Ed O. Schlotzhauer 2001-09-18
6201850 Enhanced thickness calibration and shading correction for automatic X-ray inspection 2001-03-13
6191570 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, Ed O. Schlotzhauer 2001-02-20
6051979 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, Ed O. Schlotzhauer 2000-04-18
6002739 Computed tomography with iterative reconstruction of thin cross-sectional planes 1999-12-14
5977775 System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic equipment Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, Ed O. Schlotzhauer 1999-11-02
5922079 Automated analysis of a model based diagnostic system George L. Booth, Douglas Manley 1999-07-13
5504432 System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, Ed O. Schlotzhauer 1996-04-02
5489851 Identification of pin-open faults by measuring current or voltage change resulting from temperature change Ronald J. Peiffer 1996-02-06
5469064 Electrical assembly testing using robotic positioning of probes Ronald K. Kerschner, John E. McDermid, Ed. O. Schlotzhauer, David T. Crook 1995-11-21
5392001 Capacitively-coupled amplifier with improved low frequency response Thomas F. Uhling, Ronald J. Peiffer 1995-02-21
5274336 Capacitively-coupled test probe David T. Crook, John E. McDermid, Ronald J. Peiffer, Ed O. Schlotzhauer 1993-12-28
5111137 Method and apparatus for the detection of leakage current Vance R. Harwood 1992-05-05
4860762 Dual channel resolver for real time arrythmia analysis James M. Lindauer 1989-08-29