| 11041907 |
Method and system for acquisition of test data |
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2021-06-22 |
| 10634723 |
Method and system for acquisition of test data |
Ben Rogel-Favila, Mei-Mei Su, Shunji Tachibana |
2020-04-28 |
| 10161993 |
Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block |
Andrew Niemic |
2018-12-25 |
| 9810729 |
Tester with acceleration for packet building within a FPGA block |
— |
2017-11-07 |
| 8127186 |
Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test |
Phillip D. Burlison |
2012-02-28 |
| 7865788 |
Dynamic mask memory for serial scan testing |
Phillip D. Burlison, Mei-Mei Su |
2011-01-04 |
| 7650547 |
Apparatus for locating a defect in a scan chain while testing digital logic |
Phillip D. Burlison |
2010-01-19 |
| 4422070 |
Circuit for controlling character attributes in a word processing system having a display |
Robert A. Couper, Terrance L. Lillie |
1983-12-20 |
| 4398246 |
Word processing system employing a plurality of general purpose processor circuits |
Richard E. Johnson, Terrance L. Lillie |
1983-08-09 |
| 4393377 |
Circuit for controlling information on a display |
Robert A. Couper, Terrance L. Lillie |
1983-07-12 |
| 4387424 |
Communications systems for a word processing system employing distributed processing circuitry |
Terrance L. Lillie |
1983-06-07 |
