| 6466047 |
System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources |
C. Patrick Doherty, Salman Akram |
2002-10-15 |
| 6433574 |
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
C. Patrick Doherty, Salman Akram |
2002-08-13 |
| 6366112 |
Probe card having on-board multiplex circuitry for expanding tester resources |
C. Patrick Doherty, Salman Akram |
2002-04-02 |
| 6337577 |
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
C. Patrick Doherty, Salman Akram |
2002-01-08 |
| 6300786 |
Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources |
C. Patrick Doherty, Salman Akram |
2001-10-09 |
| 6246250 |
Probe card having on-board multiplex circuitry for expanding tester resources |
C. Patrick Doherty, Salman Akram |
2001-06-12 |
