JC

John M. Callahan

NS Nanoamp Solutions: 9 patents #1 of 9Top 15%
ES Enable Semiconductor: 5 patents #1 of 4Top 25%
VT Vlsi Technology: 5 patents #103 of 594Top 20%
MI Mosaid Technologies Incorporated: 4 patents #52 of 170Top 35%
CM Conversant Intellectual Property Management: 3 patents #18 of 73Top 25%
VT Virtual Silicon Technology: 2 patents #6 of 13Top 50%
KT Kilopass Technology: 1 patents #18 of 29Top 65%
PA Philips Electronics North America: 1 patents #328 of 725Top 50%
Overall (All Time): #113,617 of 4,157,543Top 3%
32
Patents All Time

Issued Patents All Time

Showing 1–25 of 32 patents

Patent #TitleCo-InventorsDate
9722605 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2017-08-01
9350349 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2016-05-24
8854077 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2014-10-07
8253438 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2012-08-28
7940081 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2011-05-10
7592837 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2009-09-22
7443197 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2008-10-28
7348804 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2008-03-25
7227383 Low leakage and data retention circuitry Barry A. Hoberman, Daniel L. Hillman, William G. Walker, Michael A. Zampaglione, Andrew Cole 2007-06-05
7173851 3.5 transistor non-volatile memory cell using gate breakdown phenomena Hemanshu T. Vernenker, Michael Fliesler, Glen Arnold Rosendale, Harry Luan, Zhongshang Liu 2007-02-06
7069482 ROM error-correction control 2006-06-27
6977860 SRAM power reduction Michael Tooher 2005-12-20
6713855 Dual die memory 2004-03-30
6694448 SRAM row redundancy 2004-02-17
6657880 SRAM bit line architecture 2003-12-02
6593646 Dual die memory 2003-07-15
6559678 Node predisposition circuit 2003-05-06
6493414 Die information logic and protocol 2002-12-10
6355980 Dual die memory 2002-03-12
6240029 Memory column redundancy 2001-05-29
6181172 High voltage detect circuit with increased long term reliability 2001-01-30
6167543 Memory test mode circuit 2000-12-26
5942924 Digital circuit for conserving static current in an electronic device 1999-08-24
5930180 ROM bit sensing 1999-07-27
5923598 Row fuse detect circuit 1999-07-13