JL

Jerry Lobacz

AS Aehr Test Systems: 1 patents #32 of 36Top 90%
Overall (All Time): #3,511,145 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6562636 Wafer level burn-in and electrical test system and method Donald P. Richmond, II, John Hoang 2003-05-13