Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393672 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Jeongho Ahn, Seongsil Lee, Yusin Yang, Dongchul Ihm, Hyungsuk Cho | 2019-08-27 |
JO
Jae-Man Oh
Overall (All Time): #4,133,450 of 4,157,543Top 100%
1
Patents All Time