Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8065572 | At-speed scan testing of memory arrays | Thomas A. Ziaja, Murali M. R. Gala, Paul J. Dickinson, Karl P. Dahlgren, David L. Curwen +3 more | 2011-11-22 |
| 5519715 | Full-speed microprocessor testing employing boundary scan | Hong Hao, Richard F. Avra, Kanti Bhabuthmal | 1996-05-21 |