Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5850288 | Method for manufacturing a semiconductor device | Fumiki Aisou | 1998-12-15 |
| 5796484 | System for detecting unevenness degree of surface of semiconductor device | Fumiki Aisou | 1998-08-18 |
| 5661052 | Method of fabricating semiconductor device having low-resistance gate electrode and diffusion layers | Ken Inoue, Makoto Sekine, Hirohito Watanabe | 1997-08-26 |
| 5372962 | Method of making a semiconductor integrated circuit device having a capacitor with a porous surface of an electrode | Toshiyuki Hirota, Hirohito Watanabe, Masanobu Zenke | 1994-12-13 |