Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199505 | Machine learning enhanced optical-based screening for in-line wafer testing | Robin Hsin Kuo Chao, Mary Breton, Dexin Kong, Lawrence A. Clevenger | 2021-12-14 |
| 10692203 | Measuring defectivity by equipping model-less scatterometry with cognitive machine learning | Dexin Kong, Robin Hsin Kuo Chao | 2020-06-23 |