| 10486570 |
Vehicle headrest |
Koji Hayashi |
2019-11-26 |
| 10361746 |
Semiconductor device and semiconductor system |
— |
2019-07-23 |
| 10279718 |
Vehicle headrest |
Koji Hayashi |
2019-05-07 |
| 9616791 |
Seat configuration member and vehicle seat employing the seat configuration member |
Shinji Awata, Hideki Kobayashi |
2017-04-11 |
| 9505329 |
Vehicle seat and seat back board |
Shinji Awata, Hideki Kobayashi |
2016-11-29 |
| 9108552 |
Vehicle seat and resin seatback spring |
Shinji Awata |
2015-08-18 |
| 9073467 |
Vehicle seat and seat back board |
Shinji Awata, Hideki Kobayashi |
2015-07-07 |
| 8979204 |
Seat backboard and vehicle seat |
Shinji Awata, Hideki Kobayashi |
2015-03-17 |
| 7963595 |
Vehicle seats |
Hidehiro Ito, Yasuhiko Niimi, Yuji Ito |
2011-06-21 |
| 7931330 |
Air conditioning seat |
Hidehiro Itou, Yasuhiko Niimi |
2011-04-26 |
| 7079060 |
Test circuit for evaluating characteristic of analog signal of device |
Toshiaki Tarui, Masaru Sugimoto, Teruhiko Funakura |
2006-07-18 |
| 7058865 |
Apparatus for testing semiconductor integrated circuit |
Teruhiko Funakura, Hisayoshi Hanai |
2006-06-06 |
| 6990614 |
Data storage apparatus and data measuring apparatus |
Hidekazau Nagasawa, Teruhiko Funakura, Kazushi Sugiura |
2006-01-24 |
| 6934648 |
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal |
Hisayoshi Hanai, Teruhiko Funakura |
2005-08-23 |
| 6900627 |
Apparatus and method for testing semiconductor integrated circuit |
Shinji Yamada, Teruhiko Funakura |
2005-05-31 |
| 6714888 |
Apparatus for testing semiconductor integrated circuit |
Shinji Yamada, Teruhiko Funakura |
2004-03-30 |
| 6690189 |
Apparatus and method for testing semiconductor integrated circuit |
Shinji Yamada, Teruhiko Funakura |
2004-02-10 |
| 6661248 |
Tester for semiconductor integrated circuits |
Shinji Yamada, Teruhiko Funakura, Hisayoshi Hanai |
2003-12-09 |
| 6653855 |
External test auxiliary device to be used for testing semiconductor device |
Shinji Yamada, Teruhiko Funakura |
2003-11-25 |
| 6651023 |
Semiconductor test apparatus, and method of testing semiconductor device |
Shinji Yamada, Teruhiko Funakura |
2003-11-18 |
| 6642736 |
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits |
Shinji Yamada, Teruhiko Funakura |
2003-11-04 |
| 6634004 |
Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing |
Shinji Yamada, Teruhiko Funakura |
2003-10-14 |
| 6628137 |
Apparatus and method for testing semiconductor integrated circuit |
Shinji Yamada, Teruhiko Funakura |
2003-09-30 |
| 6587975 |
Semiconductor test apparatus and method |
Teruhiko Funakura |
2003-07-01 |
| 6456102 |
External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device |
Shinji Yamada, Teruhiko Funakura |
2002-09-24 |
