Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394041 | System for deriving electrical characteristics and non-transitory computer-readable medium | Yohei Nakamura, Natsuki Tsuno, Muneyuki Fukuda | 2025-08-19 |
| 12001521 | Adjusting method of charged particle beam device and charged particle beam device system | Natsuki Tsuno, Muneyuki Fukuda | 2024-06-04 |
| 11776103 | System for deriving electrical characteristics and non-transitory computer-readable medium | Natsuki Tsuno | 2023-10-03 |
| 11749494 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Muneyuki Fukuda | 2023-09-05 |
| 11694325 | System for deriving electrical characteristics and non-transitory computer-readable medium | Yohei Nakamura, Natsuki Tsuno, Muneyuki Fukuda | 2023-07-04 |
| 11646172 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Muneyuki Fukuda | 2023-05-09 |
| 11398366 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Muneyuki Fukuda | 2022-07-26 |
| 11398367 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Natsuki Tsuno, Muneyuki Fukuda | 2022-07-26 |
| 11335535 | Charged particle beam apparatus | Yohei Nakamura, Takafumi Miwa, Natsuki Tsuno, Muneyuki Fukuda | 2022-05-17 |
| 11232929 | Method for determining irradiation conditions for charged particle beam device and charged particle beam device | Natsuki Tsuno, Muneyuki Fukuda, Katsura Takaguchi | 2022-01-25 |
| 11043359 | Charged particle beam apparatus and charged particle beam inspection system | Yohei Nakamura, Natsuki Tsuno, Takafumi Miwa, Muneyuki Fukuda, Junichi Tanaka | 2021-06-22 |