Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10564216 | Multiple rate signature test to verify integrated circuit identity | Soh Ying Seah | 2020-02-18 |
| 9664736 | Multiple rate signature test to verify integrated circuit identity | Soh Ying Seah | 2017-05-30 |
| 7518392 | Systems and methods for continuity testing using a functional pattern | Trevor John Tarsi, Yun-Fu Wang, Anthony J. Lendino | 2009-04-14 |
| 7424654 | Method and apparatus for performing multi-site integrated circuit device testing | Dennis Burke, Michael Lee Martel | 2008-09-09 |
| 6941232 | Method and apparatus for performing multi-site integrated circuit device testing | Dennis Burke, Michael Lee Martel | 2005-09-06 |
| 6919727 | Accurate time measurement system circuit and method | Nicholas Flores | 2005-07-19 |
| 6750663 | Method and system for conducting continuity testing on analog devices having sensitive input nodes | — | 2004-06-15 |