Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9691501 | Testing for threshold voltage and bit cell current of non-volatile memory arrays | Daniel Robert Burggraf, III, Nelson Kei Leung | 2017-06-27 |
| 9142321 | Testing of non-volatile memory arrays | Daniel Robert Burggraf, III, Nelson Kei Leung | 2015-09-22 |
| 7518392 | Systems and methods for continuity testing using a functional pattern | Gunvant Patel, Yun-Fu Wang, Anthony J. Lendino | 2009-04-14 |