Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9691501 | Testing for threshold voltage and bit cell current of non-volatile memory arrays | Trevor John Tarsi, Nelson Kei Leung | 2017-06-27 |
| 9142321 | Testing of non-volatile memory arrays | Trevor John Tarsi, Nelson Kei Leung | 2015-09-22 |
| 8694840 | Memory test isolation logic bank with separate test enable input | Hari Pendurty | 2014-04-08 |
| 8539290 | Isolation logic between non-volatile memory and test and wrapper controllers | Hari Pendurty | 2013-09-17 |
| 8392772 | On-chip memory testing | Hari Pendurty | 2013-03-05 |