Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175592 | Methods and apparatus for inspection of a structure and associated apparatuses | Elie BADR, Shawn Shakahwat Millat, Alok Verma | 2021-11-16 |
| 10955744 | Method of determining a parameter of a pattern transfer process, device manufacturing method | Koen Van Witteveen, Wei Wang, Paul Turner, Elliott Gerard McNamara | 2021-03-23 |