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Ion guide with varying multipoles |
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2024-10-15 |
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Axially progressive lens for transporting charged particles |
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Ion guide with varying multipoles |
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2022-11-29 |
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Apparatus and method for dynamically balancing rotors |
Bartly Carlson |
2018-12-04 |
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Droplet actuation enhancement using oscillatory sliding motion between substrates in microfluidic devices |
Curt A. Flory, Arthur Schleifer |
2018-07-03 |
| 9589775 |
Plasma cleaning for mass spectrometers |
Mark Denning, Mehrnoosh Vahidpour, Guthrie Partridge |
2017-03-07 |
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Isolation of charged particle optics from vacuum chamber deformations |
— |
2016-09-20 |
| 9153427 |
Vacuum ultraviolet photon source, ionization apparatus, and related methods |
Noah Goldberg, Stuart C. Hansen |
2015-10-06 |
| 9053915 |
Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure |
Trygve Ristroph |
2015-06-09 |
| 8859961 |
Radio frequency (RF) ion guide for improved performance in mass spectrometers |
Trygve Ristroph |
2014-10-14 |
| 7675031 |
Auxiliary drag field electrodes |
Michael G. Konicek, Adrian Land, Lee Earley, Mark Hardman |
2010-03-09 |
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High throughput brightfield/darkfield water inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2009-06-30 |
| 7522275 |
High throughput darkfield/brightfield wafer inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2009-04-21 |
| 7379173 |
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2008-05-27 |
| 7259844 |
High throughput darkfield/brightfield wafer inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2007-08-21 |
| 7164475 |
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2007-01-16 |
| 6998607 |
Temperature compensated time-of-flight mass spectrometer |
Stephen C. Davis, Lee Earley, Mark Hardman, Adrian Land |
2006-02-14 |
| 6928143 |
Deployable fast-response apparatus to recover bio-contaminated materials |
John Edgar Menear, Sergey Etchin, Jeffrey Allen Moore |
2005-08-09 |
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High throughput brightfield/darkfield wafer inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2004-11-09 |
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Optical fiber Bragg grating tuning device |
Alexis Mendez, Mario Pacheco, Steve Montesanto, William Wang, Jason Zweiback |
2004-08-31 |
| 6498891 |
FBG stretching mechanism with integrated thermal compensation |
Steve Montesanto, William Wang |
2002-12-24 |
| 6288780 |
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques |
Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai |
2001-09-11 |
| 5970168 |
Fourier filtering mechanism for inspecting wafers |
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1999-10-19 |