EK

Emine Korkmaz

FE Fei: 2 patents #250 of 681Top 40%
Overall (All Time): #1,920,893 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10811223 Method of analyzing surface modification of a specimen in a charged-particle microscope Pavel Potocek, Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard 2020-10-20
10115561 Method of analyzing surface modification of a specimen in a charged-particle microscope Pavel Potocek, Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard 2018-10-30