Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10032681 | Etch metric sensitivity for endpoint detection | Andrew D. Bailey, III, Mehmet Derya Tetiker | 2018-07-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10032681 | Etch metric sensitivity for endpoint detection | Andrew D. Bailey, III, Mehmet Derya Tetiker | 2018-07-24 |