Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7880493 | Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device | Kun-Up Kim, Chang Sik Kim, Tae-Sik Son | 2011-02-01 |
| 7616020 | Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device | Kun-Up Kim, Chang Sik Kim, Tae-Sik Son | 2009-11-10 |
| 7612573 | Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads | Kun-Up Kim, Chang Sik Kim, Jong-Hyoung Lim | 2009-11-03 |
| 6909297 | Probe card | Joon-Su Ji, In-Seok Hwang, Byoung-Joo Kim, Young-Kyo Ro, Ho-Yeol Lee | 2005-06-21 |