Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11067658 | Probe card inspection wafer, probe card inspection system, and method of inspecting probe card | Dany Kim, Han-jik Nam, Jin Woo Jung | 2021-07-20 |
| 9696402 | Probe card inspection apparatus | Shin-ho Kang, Jung Woo Kim | 2017-07-04 |
| 7626413 | Parallel testing of semiconductor devices using a dividing voltage supply unit | Sang Hoon Lee, Jung-Bae Ahn | 2009-12-01 |
| 7622940 | Semiconductor device having contact failure detector | Gwang-Young Kim, Jong-Youb Kim, Boung-Lyoul Jung | 2009-11-24 |
| 7423443 | Method of performing parallel test on semiconductor devices by dividing voltage supply unit | Sang Hoon Lee, Jung-Bae Ahn | 2008-09-09 |
| 6909297 | Probe card | In-Seok Hwang, Doo-Seon Lee, Byoung-Joo Kim, Young-Kyo Ro, Ho-Yeol Lee | 2005-06-21 |
| 6906341 | Probe needle test apparatus and method | Soo-Min Byun, Byoung-Joo Kim | 2005-06-14 |
| 6813804 | Apparatus and method for cleaning probe card contacts | Byoung-Joo Kim, In-Seok Hwang, Ho-Yeol Lee, Soo-Min Byun, Hyung-Koo Kim | 2004-11-09 |
| 6571448 | Apparatus for attaching sand papers on dummy wafers | Ho-Yeol Lee, Sang-Do Lee, In-Seok Hwang | 2003-06-03 |