Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6906341 | Probe needle test apparatus and method | Joon-Su Ji, Byoung-Joo Kim | 2005-06-14 |
| 6813804 | Apparatus and method for cleaning probe card contacts | Byoung-Joo Kim, In-Seok Hwang, Ho-Yeol Lee, Hyung-Koo Kim, Joon-Su Ji | 2004-11-09 |