Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6683306 | Array foreshortening measurement using a critical dimension scanning electron microscope | Reginald R. Bowley, Jr., Emily E. Fisch | 2004-01-27 |
| 6350548 | Nested overlay measurement target | Robert K. Leidy | 2002-02-26 |