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Method and apparatus for thin film thickness mapping |
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Method and apparatus for rapid grain size analysis of polycrystalline materials |
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Method and apparatus for thin film thickness mapping |
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2004-09-14 |
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Method and apparatus for quantitative phase analysis of textured polycrystalline materials |
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2004-01-13 |
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Apparatus and method for texture analysis on semiconductor wafers |
Krzysztof Kozaczek, Paul R. Moran |
2001-10-09 |
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Photo-sensor fiber-optic stress analysis system |
— |
2000-05-02 |
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Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers |
— |
1998-12-08 |
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Photo-sensor fiber-optic stress analysis system |
— |
1998-10-27 |
| 5784432 |
Large angle solid state position sensitive x-ray detector system |
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1998-07-21 |
| 5724401 |
Large angle solid state position sensitive x-ray detector system |
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1998-03-03 |
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Superconducting composite article, and method of making the same |
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1992-07-21 |
