Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7983394 | Multiple wavelength X-ray source | Sterling W. Cornaby, Steven D. Liddiard, Charles R. Jensen | 2011-07-19 |
| 6909772 | Method and apparatus for thin film thickness mapping | David S. Kurtz, Paul R. Moran, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more | 2005-06-21 |
| 6792075 | Method and apparatus for thin film thickness mapping | David S. Kurtz, Paul R. Moran, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more | 2004-09-14 |
| 6678347 | Method and apparatus for quantitative phase analysis of textured polycrystalline materials | David S. Kurtz, Paul R. Moran, Roger Isaac Martin | 2004-01-13 |
| 6301330 | Apparatus and method for texture analysis on semiconductor wafers | David S. Kurtz, Paul R. Moran | 2001-10-09 |