David S. Kurtz — 11 Patents at Hypernex

David S. Kurtz has been granted 11 US patents while listed as an inventor at Hypernex. The first was granted in 1992 and the most recent in June 2005. David S. Kurtz ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list David S. Kurtz in Brewster, NY, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6909772	Method and apparatus for thin film thickness mapping	Krzysztof Kozaczek, Paul R. Moran, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more	2005-06-21	$6,933,000
6882739	Method and apparatus for rapid grain size analysis of polycrystalline materials	Kryzsztof J. Kozaczek, Paul R. Moran	2005-04-19	$7,105,000
6792075	Method and apparatus for thin film thickness mapping	Krzysztof Kozaczek, Paul R. Moran, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more	2004-09-14
6678347	Method and apparatus for quantitative phase analysis of textured polycrystalline materials	Krzysztof Kozaczek, Paul R. Moran, Roger Isaac Martin	2004-01-13
6301330	Apparatus and method for texture analysis on semiconductor wafers	Krzysztof Kozaczek, Paul R. Moran	2001-10-09
6058160	Photo-sensor fiber-optic stress analysis system	—	2000-05-02
5848122	Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers	—	1998-12-08	$4,198,000
5828724	Photo-sensor fiber-optic stress analysis system	—	1998-10-27	$2,818,000
5784432	Large angle solid state position sensitive x-ray detector system	Clay O. Ruud	1998-07-21
5724401	Large angle solid state position sensitive x-ray detector system	Clay O. Ruud	1998-03-03
5132278	Superconducting composite article, and method of making the same	Ward C. Stevens	1992-07-21

David S. Kurtz — 11 Patents

Issued Patents All Time

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