Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6909772 | Method and apparatus for thin film thickness mapping | Krzysztof Kozaczek, Paul R. Moran, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more | 2005-06-21 |
| 6882739 | Method and apparatus for rapid grain size analysis of polycrystalline materials | Kryzsztof J. Kozaczek, Paul R. Moran | 2005-04-19 |
| 6792075 | Method and apparatus for thin film thickness mapping | Krzysztof Kozaczek, Paul R. Moran, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more | 2004-09-14 |
| 6678347 | Method and apparatus for quantitative phase analysis of textured polycrystalline materials | Krzysztof Kozaczek, Paul R. Moran, Roger Isaac Martin | 2004-01-13 |
| 6301330 | Apparatus and method for texture analysis on semiconductor wafers | Krzysztof Kozaczek, Paul R. Moran | 2001-10-09 |
| 6058160 | Photo-sensor fiber-optic stress analysis system | — | 2000-05-02 |
| 5848122 | Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers | — | 1998-12-08 |
| 5828724 | Photo-sensor fiber-optic stress analysis system | — | 1998-10-27 |
| 5784432 | Large angle solid state position sensitive x-ray detector system | Clay O. Ruud | 1998-07-21 |
| 5724401 | Large angle solid state position sensitive x-ray detector system | Clay O. Ruud | 1998-03-03 |
| 5132278 | Superconducting composite article, and method of making the same | Ward C. Stevens | 1992-07-21 |