CH

Craig Hickman

Micron: 18 patents #949 of 6,345Top 15%
NT Nanya Technology: 1 patents #447 of 775Top 60%
XD X Development: 1 patents #441 of 653Top 70%
Overall (All Time): #220,659 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11407117 Robot centered augmented reality system 2022-08-09
9134628 Overlay mark and application thereof Jianming Zhou 2015-09-15
8555208 Systems and methods for implementing and manufacturing reticles for use in photolithography tools 2013-10-08
8400634 Semiconductor wafer alignment markers, and associated systems and methods Jianming Zhou, Yuan He 2013-03-19
8029947 Systems and methods for implementing and manufacturing reticles for use in photolithography tools 2011-10-04
7370659 Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines Paul D. Shirley 2008-05-13
7361234 Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines Paul D. Shirley 2008-04-22
7298453 Method and apparatus for irradiating a microlithographic substrate Ulrich Boettiger, Scott L. Light, William T. Rericha 2007-11-20
7038762 Method and apparatus for irradiating a microlithographic substrate Ulrich Boettiger, Scott L. Light, William T. Rericha 2006-05-02
6967707 Device and method of correcting exposure defects in photolithography 2005-11-22
6909984 Wafer alignment system James W. Laursen 2005-06-21
6844933 System for processing semiconductor products 2005-01-18
6817057 Spindle chuck cleaner Paul D. Shirley 2004-11-16
6812999 Device and method of correcting exposure defects in photolithography 2004-11-02
6784975 Method and apparatus for irradiating a microlithographic substrate Ulrich Boettiger, Scott L. Light, William T. Rericha 2004-08-31
6727975 Device and method of correcting exposure defects in photolithography 2004-04-27
6708131 Wafer alignment system James W. Laursen 2004-03-16
6529274 System for processing semiconductor products 2003-03-04
6519036 System for processing semiconductor products 2003-02-11
6297877 Methods for compensating for lens heating resulting from wafer reflectance in micro-photolithography equipment 2001-10-02