Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7253606 | Framework that maximizes the usage of testhead resources in in-circuit test system | Aik Koon Loh, Roy Williams, Keen Fung Wai, Yi Jin, Rex Shang +2 more | 2007-08-07 |
| 7089139 | Method and apparatus for configuration of automated debug of in-circuit tests | Aik Koon Loh, Keen Fung Wai, Tiam Hock Tan, Roy Williams, Daniel Whang +1 more | 2006-08-08 |