Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7324982 | Method and apparatus for automated debug and optimization of in-circuit tests | Aik Koon Loh, Keen Fung Wai, Roy Williams | 2008-01-29 |
| 7253606 | Framework that maximizes the usage of testhead resources in in-circuit test system | Aik Koon Loh, Roy Williams, Keen Fung Wai, Chen Ni Low, Yi Jin +2 more | 2007-08-07 |
| 7089139 | Method and apparatus for configuration of automated debug of in-circuit tests | Aik Koon Loh, Keen Fung Wai, Roy Williams, Daniel Whang, Chen Ni Low +1 more | 2006-08-08 |