Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7324982 | Method and apparatus for automated debug and optimization of in-circuit tests | Keen Fung Wai, Tiam Hock Tan, Roy Williams | 2008-01-29 |
| 7321885 | Product framework for managing test systems, supporting customer relationships management and protecting intellectual knowledge in a manufacturing testing environment | — | 2008-01-22 |
| 7253606 | Framework that maximizes the usage of testhead resources in in-circuit test system | Roy Williams, Keen Fung Wai, Chen Ni Low, Yi Jin, Rex Shang +2 more | 2007-08-07 |
| 7089139 | Method and apparatus for configuration of automated debug of in-circuit tests | Keen Fung Wai, Tiam Hock Tan, Roy Williams, Daniel Whang, Chen Ni Low +1 more | 2006-08-08 |
| 6242756 | Cross optical axis inspection system for integrated circuits | Peng Seng Toh, Chiat Pin Tay, Ying Jian Wang | 2001-06-05 |