Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12223641 | Defect detection of a semiconductor specimen | Boaz Dudovich, Assaf Ariel, Amir Bar, Lior Yehieli, Shiran Ben Israel +3 more | 2025-02-11 |
CI
Chen Itzikowitz
Overall (All Time): #2,387,732 of 4,157,543Top 60%
1
Patents All Time