Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5382831 | Integrated circuit metal film interconnect having enhanced resistance to electromigration | Eugenia Atakov, John Clement | 1995-01-17 |
| 4810619 | Photolithography over reflective substrates comprising a titanium nitride layer | Thomas R. Pampalone, Edward Douglas | 1989-03-07 |