Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062850 | Method of forming electrical interconnects having electromigration-inhibiting segments to a critical length | Adam Shepela, Lawrence Bair, John Clement, Bruce Gieseke | 2006-06-20 |
| 6904675 | Method of forming electrical interconnects having electromigration-inhibiting plugs | Adam Shepela, Lawrence Bair, John Clement, Bruce Gieseke | 2005-06-14 |
| 6678951 | Method of forming electrical interconnects having electromigration-inhibiting plugs | Adam Shepela, Lawrence Bair, John Clement, Bruce Gieseke | 2004-01-20 |
| 6245996 | Electrical interconnect structure having electromigration-inhibiting segments | Adam Shepela, Lawrence Bair, John Clement, Bruce Gieseke | 2001-06-12 |
| 5382831 | Integrated circuit metal film interconnect having enhanced resistance to electromigration | John Clement, Brian C. Lee | 1995-01-17 |